Researcher Profile

Takeo Kamino

Visiting Professor

Specialty
Material Characterization using transmission electron microscope
e-mail address
tkamino@yamanashi.ac.jp

History

Affiliation Fuel Cell Nanomaterials Center
Education 1963Hachinohe Industrial High School
1997Ibaraki University
Degree Doctor of Engineering
Professional Career 1963Hitachi , Ltd
1984Nagoya University
2005Hitachi High Technologies
Prizes / Awards 1997The Japanese Society of Microscopy Outstanding Technologist
2005MRS Best Poster Award
2009The Japanese Society of Microscopy Prize
2012The Vacuum Technology Award

Specialties

Subject of Study Structural characterization of nano-materials
Development and application of in-situ electron microscopy
Research KeywordsHigh Resolution Electron microscopy
Atomic level structural characterization
Academic Society Affiliations The Japanese Society of Microscopy
Fuel Cell Nanomaterials Center, University of Yamanashi

Research Achievements

PublicationsPapers, Books
  1. Introduction to Focused Ion Beam,Springer(2003)(collaboration)
  2. Focused Ion Beam Systems, Cambridge University Press(2007)(collaboration)

Symposia and Conferences
  1. In situ HREM heating experiments at very high temperatures, T.Kamino and H.Saka, Proc. of Arizona State Univ. Winter workshop, Tempe, USA, p5(1998)
  2. High temperature-high resolution electron microscopy and its application, Proc. of Japan-USA In-situ EM Seminar, Kyoto, Japan, pp23-25(2000)
  3. Development of a dedicated FIB-STEM system for pin-point failure analysis, T.Kamino, T.Ishitani and T.Onishi, Proc. of M&M2000 Meeting, Philadelphia, USA(2000)
  4. A dedicated FIB-STEM system fand its application to pin-point failure analysis, T.Kamino, T.Ishitani and T.Onishi, Proc. of FIB2001 Meeting, Oxford, UK(2001)
  5. A method for site specific structural analysis using a dedicated FIB system, T.Kamino, T.Ishitani and T.Onishi, Proc. of M&M2002 Meeting, Quebec City, Canada(2002)
  6. Micro-sampling technique and its application, T.Kamino, T.Ishitani and T.Onishi, Proc. of Advances in FIB microscopy FIB2003, Cambridge, UK(2003)
  7. Pin-point materials characterization using a dedicated FIB system, T. Kamino, T. Ishitani and Y. Yaguchi, Proc. of Nano FIB Workshop 2004, Sheffield, UK(2004)
  8. Site specific structural characterization by micro-sampling technique, Proc. of 8APEM 2004, Kanazawa, Japan(2004)
  9. Site specific materials characterization using FIB-STEM system, Proc. of FE-TEM meeting 2004 / UK, Cambridge(2004)
  10. FIB micro-sampling technique and its application, Proc. of EMC 2004,Antwerpen, Belgium, Antwerp(2004)
  11. Site specific failure analysis using a dedicated FIB system and a micro-sampling technique, T.Kamino, K.Umemura, T.Onishi and M.Konno, Proc. of Microscopy of Semiconductor Materials, Oxford, UK(2005)
  12. Site-specific materials characterization using a dedicated FIB system, T. Kamino, T. Ishitani and Y. Yaguchi, Proc. of Nano FIB Meeting, Oxford, UK (2005)
  13. 3D characterization using a FIB-STEM compatible specimen rotation holder, T.Kamino, T.Yaguchi, T.Ishitani and T.Onishi, Proc. of Nano FIB Workshop 2005, London, UK(2005)
  14. Development of high Temperature high resolution electron microscope techniques and its application to material science, Proc. of MRS 2005 Fall Meeting, Boston, USA(2005)
  15. FIB-STEM system for 3D analysis, T.Kamino, Proc. of MICROSCIENCE 2006, London, UK(2006)
  16. High Temperature-high resolution electron microscopy and its application, T.Kamino and T.Yaguchi, Proc. of In situ EM and Analysis 2006, London, UK (2006)
  17. In-situ high temperature TEM observation of gas solid reaction, T.Kamino, T.Yaguchi, A.Watanabe and Y.Nagakubo, Proc. of M&M 2006, Chicago, USA(2006)
  18. High temperature TEM and its application to nano-materials, T.Kamino, T.Yaguchi and A. Watabe, Proc. of MSC meeting, Edmonton, Canada(2007)
  19. Development of a specimen heating holder for high resolution TEM observation and its application, T.Kamino, M.Ukiana and T.Yaguchi, Proc. of M&M 2007, Fort Lauderdale, USA(2007)
  20. In-situ observation of gas-solid reaction, T.Kamino, A.Watabe, Y.Nagakubo and T.Yaguchi, Proc. of EMAG 2007, Glasgow, UK(2007)
  21. FIB technique for TEM sample preparation, T.Kamino, T.Onishi, T.Yaguchi, and M.Konno Proc. of MSC 2008 /Canada, Montreal (23 May 2008)(Tutorial)
  22. In-situ high resolution TEM observation of gas-solid reaction, T.Kamino, A.Watabe, Y.Nagakubo and T.Yaguchi, Proc. of APMC9, Jeju, Korea(2008)
  23. In-situ observation of gas-solid reaction, T.Kamino, T.Yaguchi, and A.Watanabe, Proc. of ISAEM 2008, Nagoya, Japan(2008)

Extramural Activities
  1. A member of the board of The Japanese Society of Microscopy